Author: Ahmed, N.

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4 articles found

Analytical Analysis of Different Karats of Gold Using Laser Induced Breakdown Spectroscopy(LIBS) and Laser Ablation Time of Flight Mass Spectrometer (LA-TOF-MS)

Author: Ahmed, N. ; et. al.

Journal: Plasma Chemistry and Plasma Processing (2018)

Applications

DOI: 10.1007/s11090-017-9862-2

Authors
Ahmed, R. ; Baig, M. A.

Keywords

LIBS; Karats of gold; Elemental composition; Plasma parameters; LA-TOF-mass spectrometry;ELEMENTAL ANALYSIS; OSCILLATOR-STRENGTHS; INDUCED PLASMA; ALLOYS; TRANSITIONS; LIFETIMES; LITHIUM; SAMPLES; LINES

Abstract

Laser induced breakdown spectroscopy (LIBS) coupled with a laser ablation time of flight mass spectrometer (LA-TOF-MS) has been developed for discrimination/analysis of the precious gold alloys cartage. Five gold alloys of Karats 18K, 19K, 20K, 22K and 24K having certified composition of gold as 75, 79, 85, 93 and 99.99% were tested and their precise elemental compositions were determined using the laser produced plasma technique. The plasma was generated by focusing beam of a Nd:YAG laser on the target in air and its time integrated emission spectra were registered in the range 250-870 nm. The calibration free LIBS technique (CF-LIBS) was used for the quantitative determination of the constituent elements present in different Karats of gold. Elemental compositions of these gold alloys were also determined using a Laser Ablation time of flight mass spectrometer (LA-TOF-MS). The LIBS limit of detection was calculated from the calibration curves for copper, silver and gold. Results of CF-LIBS and LA-TOF-MS are in excellent agreement with the certified values. It is demonstrated that LIBS coupled with LA-TOF-MS is an efficient technique that can be used to analyze any precious alloys in a fraction of a second.

Area:

Industry

Material:

Gold

Elements:

Lines [nm]:

Cu I 261.84 nm Cu I 282.44 nm Cu I 293.31 nm Cu I 296.12 nm Cu I 299.74 nm Cu I 324.75 nm Cu I 327.40 nm Cu I 330.79 nm Cu I 465.11 nm Cu I 510.55 nm Cu I 515.32 nm Cu I 521.82 nm Cu I 529.25 nm Cu I 570.02 nm Cu I 578.21 nm Cu I 809.26 nm

Lines [nm]:

Au I 264.15 nm Au I 267.60 nm Au I 268.87 nm Au I 270.09 nm Au I 274.83 nm Au I 288.35 nm Au I 302.92 nm Au I 312.28 nm Au I 322.53 nm Au I 406.51 nm Au I 479.26 nm Au I 481.16 nm Au I 523.03 nm Au I 583.74 nm Au I 627.82 nm Au I 751.07 nm

Lines [nm]:

Ag I 328.07 nm Ag I 520.91 nm Ag I 546.55 nm Ag II 250.71 nm Ag II 266.04 nm Ag II 276.75 nm Ag II 283.76 nm Ag II 289.63 nm Ag II 795.73 nm

Lines [nm]:

N I 742.36 nm N I 744.23 nm N I 746.83 nm N I 818.49 nm N I 821.63 nm N I 868.03 nm

Lines [nm]:

O I 777.19 nm O I 777.42 nm O I 777.54 nm O I 844.62 nm O I 844.64 nm O I 844.68 nm

...

Emmision lines:
Ag II 250.71 nm
Cu I 261.84 nm
Au I 264.15 nm
Ag II 266.04 nm
Au I 267.60 nm
Au I 268.87 nm
Au I 270.09 nm
Au I 274.83 nm
Ag II 276.75 nm
Cu I 282.44 nm
Ag II 283.76 nm
Au I 288.35 nm
Ag II 289.63 nm
Cu I 293.31 nm
Cu I 296.12 nm
Cu I 299.74 nm
Au I 302.92 nm
Au I 312.28 nm
Au I 322.53 nm
Cu I 324.75 nm
Cu I 327.40 nm
Ag I 328.07 nm
Cu I 330.79 nm
Au I 406.51 nm
Cu I 465.11 nm
Au I 479.26 nm
Au I 481.16 nm
Cu I 510.55 nm
Cu I 515.32 nm
Ag I 520.91 nm
Cu I 521.82 nm
Au I 523.03 nm
Cu I 529.25 nm
Ag I 546.55 nm
Cu I 570.02 nm
Cu I 578.21 nm
Au I 583.74 nm
Au I 627.82 nm
H I 656.28 nm
N I 742.36 nm
N I 744.23 nm
N I 746.83 nm
Au I 751.07 nm
O I 777.19 nm
O I 777.42 nm
O I 777.54 nm
Ag II 795.73 nm
Cu I 809.26 nm
N I 818.49 nm
N I 821.63 nm
O I 844.62 nm
O I 844.64 nm
O I 844.68 nm
N I 868.03 nm

Quantitative analysis of a brass alloy using CF-LIBS and a laser ablation time-of-flight mass spectrometer

Author: Ahmed, N. ; et. al.

Journal: Laser Physics (2018)

Applications

DOI: 10.1088/1555-6611/aa962b

Authors
Abdullah, M. ; Ahmed, R. ; Baig, M. A. ; Piracha, N. K.

Keywords

CF-LIBS; internal reference self-absorption correction (IRSAC); brass; quantitative analysis; plasma parameters; energy dispersive x-ray spectroscopy (EDX); laser ablation time-of-flight mass spectrometry (LA-TOF-MS);INDUCED BREAKDOWN SPECTROSCOPY; CALIBRATION-FREE; ELEMENTAL ANALYSIS; PLASMA TEMPERATURE; PARAMETERS; ACCURACY

Abstract

We present a quantitative analysis of a brass alloy using laser induced breakdown spectroscopy, energy dispersive x-ray spectroscopy (EDX) and laserablation time-of-flight mass spectrometry (LA-TOF-MS). The emission lines of copper (Cu I) and zinc (Zn I), and the constituent elements of the brass alloy were used to calculate the plasma parameters. The plasma temperature was calculated from the Boltzmann plot as (10 000 +/- 1000) K and the electron number density was determined as (2.0 +/- 0.5) x 10(17) cm(-3) from the Stark-broadened Cu I line as well as using the Saha-Boltzmann equation. The elemental composition was deduced using these techniques: the Boltzmann plot method (70% Cu and 30% Zn), internal reference self-absorption correction (63.36% Cu and 36.64% Zn), EDX (61.75% Cu and 38.25% Zn), and LA-TOF (62% Cu and 38% Zn), whereas, the certified composition is (62% Cu and 38% Zn). It was observed that the internal reference self-absorption correction method yields analytical results comparable to that of EDX and LA-TOF-MS.

Area:

Industry

Material:

Brass

Elements:

Lines [nm]:

Cu I 427.51 nm Cu I 465.11 nm Cu II 268.93 nm Cu II 271.35 nm Cu I 261.84 nm Cu I 282.44 nm Cu I 296.12 nm Cu I 319.41 nm Cu I 458.70 nm Cu I 510.55 nm Cu I 515.32 nm Cu I 521.82 nm Cu I 529.25 nm Cu I 578.21 nm

Lines [nm]:

Zn I 277.09 nm Zn I 330.26 nm Zn I 328.23 nm Zn I 334.50 nm Zn II 250.20 nm Zn II 255.80 nm Zn I 472.22 nm Zn I 481.05 nm

Emmision lines:
Zn II 250.20 nm
Zn II 255.80 nm
Cu I 261.84 nm
Cu II 268.93 nm
Cu II 271.35 nm
Zn I 277.09 nm
Cu I 282.44 nm
Cu I 296.12 nm
Cu I 319.41 nm
Zn I 328.23 nm
Zn I 330.26 nm
Zn I 334.50 nm
Cu I 427.51 nm
Cu I 458.70 nm
Cu I 465.11 nm
Zn I 472.22 nm
Zn I 481.05 nm
Cu I 510.55 nm
Cu I 515.32 nm
Cu I 521.82 nm
Cu I 529.25 nm
Cu I 578.21 nm

A comparative study of Cu-Ni Alloy using LIBS, LA-TOF, EDX, and XRF

Author: Ahmed, N. ; et. al.

Journal: Laser and Particle Beams (2017)

Applications

DOI: 10.1017/S0263034616000732

Authors
Ahmed, R. ; Baig, M. A. ; Rafique, M. S.

Keywords

CF-LIBS; CuNi alloy; Electron density; LA-TOFMS; LIBS; Plasma temperature; Quantitative analysis;LASER-INDUCED BREAKDOWN; QUANTITATIVE ELEMENTAL ANALYSIS; INDUCED PLASMA; SPECTROSCOPY; SPECTROMETRY; EMISSION

Abstract

LASER induced breakdown spectroscopy (LIBS) has been used for the quantitative analysis of Cu-Ni alloy of known composition (75% Cu, 25% Ni) using the one line calibration free-LIBS (OLCF-LIBS), self-calibration-LIBS (SC-LIBS), calibration free LIBS (CF-LIBS), time of flight-mass spectroscopy (TOF-MS), energy dispersive X-ray spectroscopy (EDX) and X-ray fluorescence spectroscopy (XRF). For the LIBS-based studies, the plasma was generated by focusing the beam of a Q-switched Nd:YAG laser (532 nm, pulse energy about 200 mJ, 5 ns pulse duration) while the sample was placed in air at an atmospheric pressure. Plasma temperature about (9500 +/- 300) K was calculated by the Boltzmann plot method using the neutral lines of Cu and Ni whereas the electron number density was calculated (2.0 +/- 0.5) x 10(16) cm(-3) from the Stark broadening of an isolated Cu line as well as using the relative intensities of the neutral and singly ionized optically thin lines in the Saha-Boltzmann equation. The elemental compositions determined by different LIBS methods and standard techniques are; OLCF-LIBS (69% Cu and 31% Ni), SC-LIBS (72% Cu and 28% Ni), CF-LIBS (74% Cu and 26% Ni), TOF (74% Cu and 26% Ni), EDX (75% Cu and 24.5% Ni), XRF (73% Cu and 24.7% Ni), and LA-TOF (74% Cu and 26% Ni). It is demonstrated that the CF-LIBS method gives compositions comparable with that determined by LA-TOF, EDX, or XRF, which is also in agreement with the certified reported composition.

Area:

Industry

Material:

Copper-nickel alloy

Elements:

Lines [nm]:

Ni I 300.25 nm Ni I 301.20 nm Ni I 305.08 nm Ni I 339.30 nm Ni I 344.63 nm Ni I 345.85 nm Ni I 346.17 nm Ni I 356.64 nm Ni I 490.44 nm

Lines [nm]:

Cu I 296.12 nm Cu I 450.94 nm Cu I 453.97 nm Cu I 458.70 nm Cu I 510.55 nm Cu I 515.32 nm Cu I 521.82 nm Cu I 570.02 nm Cu I 578.21 nm

Emmision lines:
Cu I 296.12 nm
Ni I 300.25 nm
Ni I 301.20 nm
Ni I 305.08 nm
Ni I 339.30 nm
Ni I 344.63 nm
Ni I 345.85 nm
Ni I 346.17 nm
Ni I 356.64 nm
Cu I 450.94 nm
Cu I 453.97 nm
Cu I 458.70 nm
Ni I 490.44 nm
Cu I 510.55 nm
Cu I 515.32 nm
Cu I 521.82 nm
Cu I 570.02 nm
Cu I 578.21 nm

On the elemental analysis of different cigarette brands using laser induced breakdownspectroscopy and laser-ablation time of flight mass spectrometry

Author: Ahmed, N. ; et. al.

Journal: Spectrochimica Acta Part B: Atomic Spectroscopy (2017)

Applications

DOI: 10.1016/j.sab.2017.08.006

Authors
Ahmed, R. ; Baig, M. A. ; Umar, Z. A.

Keywords

LIBS; Cigarette brands; Elemental composition; Plasma parameters; LA-TOF-mass spectrometry;TOBACCO; CRYSTAL; SAMPLES; PLASMA

Abstract

We present qualitative and quantitative analysis of the trace elements present in different brands of tobacco available in Pakistan using laser inducedbreakdown spectroscopy (LIBS) and Laser ablation Time of Flight Mass Spectrometer (LA-TOFMS). The compositional analysis using the calibration free LIBS technique is based on the observed emission spectra of the laser produced plasma plume whereas the elemental composition analysis using IA-TOFMS is based on the mass spectra of the ions produced by laser ablation. The optical emission spectra of these samples contain spectral lines of calcium, magnesium, sodium, potassium, silicon, strontium, barium, lithium and aluminum with varying intensities. The corresponding mass spectra of the elements were detected in LA-TOF-MS with their composition concentration. The analysis of different brands of cigarettes demonstrates that LIBS coupled with a LA-TOF-MS is a powerful technique for the elemental analysis of the trace elements in any solid sample. (C) 2017 Elsevier B.V. All rights reserved.

Area:

Agriculture ; Industry

Material:

Cigarette

Elements:

Lines [nm]:

Ca I 428.94 nm Ca I 429.90 nm Ca I 431.87 nm Ca I 458.15 nm Ca I 487.81 nm Ca I 558.88 nm Ca I 559.85 nm Ca I 585.75 nm Ca I 612.22 nm Ca I 616.13 nm Ca I 644.98 nm Ca I 647.17 nm Ca I 649.38 nm Ca II 315.89 nm Ca II 317.96 nm Ca II 370.60 nm Ca II 373.69 nm Ca II 849.80 nm Ca II 854.21 nm

Lines [nm]:

Mg I 383.23 nm Mg II 280.27 nm Mg II 279.55 nm

Emmision lines:
Mg II 279.55 nm
Mg II 280.27 nm
Ca II 315.89 nm
Ca II 317.96 nm
Ca II 370.60 nm
Ca II 373.69 nm
Mg I 383.23 nm
Ca I 428.94 nm
Ca I 429.90 nm
Ca I 431.87 nm
Ca I 458.15 nm
Ca I 487.81 nm
Ca I 558.88 nm
Ca I 559.85 nm
Ca I 585.75 nm
Ca I 612.22 nm
Ca I 616.13 nm
Ca I 644.98 nm
Ca I 647.17 nm
Ca I 649.38 nm
Ca II 849.80 nm
Ca II 854.21 nm

Co-author: Ahmed, N.

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Author: Ahmed, N.

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Co-author: Ahmed, N.

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