LA-LIES; Dual-pulse; Elemental analysis; Low sample destruction;INDUCED BREAKDOWN SPECTROSCOPY; SIGNAL ENHANCEMENT; LASER-ABLATION; NANOSECOND; PLASMA
A study on elemental analysis of alloy samples under low sample destruction with dual-pulse laser-ablation laser induced breakdown spectroscopy (LA-LIES) based on one picosecond Nd : YAG laser is presented. In LA-LIBS, low pulse energy 532 nm laser was used for sample ablation and high pulse energy, time - delayed 1 064 nm laser was used for re-excitation of the ablated samples to enhance atomic emissions of the laser-induced plasma and signal detection sensitivity. The influence of pulse energies of the ablation laser and excitation laser to the signal intensities was studied experimentally. I was observed that Cu 324. 75 nm line intensity in LA-LIBS was enhanced 86 times in comparison with that obtained in SP-LIES under 10 mu J pulse energy of the ablation laser and 2. 5 mJ pulse energy of the excitation laser. The diameter of the crater generated in LA-LIES was less than 10 pin. It is demonstrated the possibility of using dual-pulse LA-LIBS to realize elemental analysis of solid sample under low sample destruction. This technique is valuable for elemental analysis of precious samples and 2D elements mapping under high spatial resolution.