Author: Aguilera, J. A.

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Analysis of rocks by CSigma laser-induced breakdown spectroscopy with fused glass sample preparation

Author: Aguilera, J. A. ; et. al.

Journal: Journal of Analytical Atomic Spectrometry (2017)

Applications

DOI: 10.1039/c6ja00360e

Authors
Aragón, C.

Keywords

II SPECTRAL-LINES; ATOMIC TRANSITION-PROBABILITIES; STARK-BROADENING PARAMETERS; CALIBRATION-FREE; INDUCEDPLASMA; QUANTITATIVE-ANALYSIS; CRITICAL COMPILATION; SELF-ABSORPTION; WIDTHS; SHIFTS

Abstract

We report a validation experiment of the C sigma-LIBS method, proposed recently by our group for quantitative laser-induced breakdown spectroscopy. This method is applied to determine eight elements (Si, Al, Ca, Mg, Fe, Ti, Mn, and V) in rocks prepared as fused glass samples, having a wide range of certified concentrations. The characterization stage of the method is performed using only two standard fused glass samples prepared from mixtures of pure compounds (SiO2, Al2O3, Fe2O3 and CaCO3). The average precision obtained is 3.4% for concentrations higher than 0.1 wt%. This validation suggests that the accuracy and precision of this technique, if combined with fused glass sample preparation under favourable conditions, may become as good as those produced by certification laboratories.

Area:

Geology ; Industry

Material:

Fused glass

Elements:

Lines [nm]:

Fe I 363.15 nm Fe I 364.78 nm Fe I 373.49 nm Fe I 374.95 nm Fe I 376.38 nm Fe I 376.55 nm Fe I 376.72 nm Fe II 258.26 nm Fe II 258.59 nm Fe II 259.15 nm Fe II 259.28 nm Fe II 259.84 nm Fe II 259.94 nm Fe II 260.71 nm Fe II 261.19 nm Fe II 261.38 nm Fe II 261.76 nm Fe II 262.17 nm Fe II 271.18 nm Fe II 271.44 nm Fe II 271.62 nm Fe II 272.49 nm Fe II 273.07 nm Fe II 274.32 nm Fe II 275.33 nm

Lines [nm]:

Ca I 428.30 nm Ca I 428.94 nm Ca I 429.90 nm Ca I 431.87 nm Ca II 315.89 nm Ca II 317.93 nm Ca II 370.60 nm Ca II 373.69 nm Ca II 393.37 nm Ca II 396.85 nm

Lines [nm]:

Mg I 277.67 nm Mg I 277.83 nm Mg I 277.98 nm Mg I 278.14 nm Mg I 278.30 nm Mg II 279.08 nm Mg II 279.55 nm Mg II 279.80 nm Mg II 280.27 nm

Lines [nm]:

Si I 220.80 nm Si I 221.09 nm Si I 221.17 nm Si I 221.67 nm Si I 221.81 nm Si I 250.69 nm Si I 251.61 nm Si I 252.41 nm Si I 252.85 nm

Lines [nm]:

Al I 265.25 nm Al I 266.04 nm Al I 308.22 nm Al I 309.27 nm Al I 394.40 nm Al I 396.15 nm

...

Emmision lines:
Si I 220.80 nm
Si I 221.09 nm
Si I 221.17 nm
Si I 221.67 nm
Si I 221.81 nm
Si I 250.69 nm
Si I 251.61 nm
Si I 252.41 nm
Si I 252.85 nm
Fe II 258.26 nm
Fe II 258.59 nm
Fe II 259.15 nm
Fe II 259.28 nm
Mn II 259.37 nm
Fe II 259.84 nm
Fe II 259.94 nm
Mn II 260.57 nm
Fe II 260.71 nm
Fe II 261.19 nm
Fe II 261.38 nm
Fe II 261.76 nm
Fe II 262.17 nm
Al I 265.25 nm
Al I 266.04 nm
Fe II 271.18 nm
Fe II 271.44 nm
Fe II 271.62 nm
Fe II 272.49 nm
Fe II 273.07 nm
Fe II 274.32 nm
Fe II 275.33 nm
Mg I 277.67 nm
Mg I 277.83 nm
Mg I 277.98 nm
Mg I 278.14 nm
Mg I 278.30 nm
Mg II 279.08 nm
Mg II 279.55 nm
Mg II 279.80 nm
Mg II 280.27 nm
V II 289.33 nm
V II 290.88 nm
V II 292.46 nm
Mn II 293.31 nm
Mn II 293.93 nm
Mn II 294.92 nm
Al I 308.22 nm
Al I 309.27 nm
Ca II 315.89 nm
Ca II 317.93 nm
Ti II 334.19 nm
Ti II 336.12 nm
Ti II 337.28 nm
Ti II 338.03 nm
Ti II 338.38 nm
Fe I 363.15 nm
Fe I 364.78 nm
Ca II 370.60 nm
Fe I 373.49 nm
Ca II 373.69 nm
Fe I 374.95 nm
Fe I 376.38 nm
Fe I 376.55 nm
Fe I 376.72 nm
Ca II 393.37 nm
Al I 394.40 nm
Al I 396.15 nm
Ca II 396.85 nm
Ca I 428.30 nm
Ca I 428.94 nm
Ca I 429.90 nm
Ca I 431.87 nm

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Author: Aguilera, J. A.

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Co-author: Aguilera, J. A.

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