Author: Sdvizhenskii, P. A.

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Co-author: Sdvizhenskii, P. A.

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4 articles found

Combining Raman and laser induced breakdown spectroscopy by double pulse lasing

Author: Lednev, V. N. ; et. al.

Journal: Analytical and Bioanalytical Chemistry (2018)

Applications

DOI: 10.1007/s00216-017-0719-6

Authors
Bukin, V. V. ; Fedorov, A. N. ; Grishin, M. Y. ; Oshurko, V. B. ; Pershin, S. M. ; Sdvizhenskii, P. A. ; Shchegolikhin, A. N.

Keywords

Laser induced breakdown spectroscopy; LIBS; Raman scattering; Double pulse; Quantitative analysis;QUANTITATIVE-ANALYSIS; LIBS; SPECTROMETER; MICROSCOPY; MINERALS; PIGMENTS; PLATFORM; ASPIRIN; SYSTEM; CRATER

Abstract

A new approach combining Raman spectrometry and laser induced breakdown spectrometry (LIBS) within a single laser event was suggested. A pulsed solid state Nd:YAG laser running in double pulse mode (two frequency-doubled sequential nanosecond laser pulses with dozens microseconds delay) was used to combine two spectrometry methods within a single instrument (Raman/LIBS spectrometer). First, a low-energy laser pulse (power density far below ablation threshold) was used for Raman measurements while a second powerful laser pulse created the plasma suitable for LIBS analysis. A short time delay between two successive pulses allows measuring LIBS and Raman spectra at different moments but within a single laser flash-lamp pumping. Principal advantages of the developed instrument include high quality Raman/LIBS spectra acquisition (due to optimal gating for Raman/LIBS independently) and absence of target thermal alteration during Raman measurements. A series of high quality Raman and LIBS spectra were acquired for inorganic salts (gypsum, anhydrite) as well as for pharmaceutical samples (acetylsalicylic acid). To the best of our knowledge, the quantitative analysis feasibility by combined Raman/LIBS instrument was demonstrated for the first time by calibration curves construction for acetylsalicylic acid (Raman) and copper (LIBS) in gypsum matrix. Combining ablation pulses and Raman measurements (LIBS/Raman measurements) within a single instrument makes it an efficient tool for identification of samples hidden by non-transparent covering or performing depth profiling analysis including remote sensing.

Area:

Pharmaceutics

Material:

Acetylsalicylic acid ; Anhydrite ; Gypsum

Elements:

Lines [nm]:

Ca II 317.93 nm Ca II 393.37 nm Ca II 396.85 nm Ca I 364.44 nm Ca I 422.67 nm Ca I 443.50 nm Ca I 445.48 nm Ca I 487.81 nm Ca I 504.16 nm Ca I 518.89 nm Ca I 526.56 nm Ca I 559.45 nm Ca I 616.96 nm Ca I 646.26 nm

Lines [nm]:

Na I 589.00 nm Na I 589.59 nm

Lines [nm]:

H I 656.28 nm

Lines [nm]:

S I 469.41 nm

Lines [nm]:

Cu I 352.42 nm

Emmision lines:
Ca II 317.93 nm
Cu I 352.42 nm
Ca I 364.44 nm
Ca II 393.37 nm
Ca II 396.85 nm
Ca I 422.67 nm
Ca I 443.50 nm
Ca I 445.48 nm
S I 469.41 nm
Ca I 487.81 nm
Ca I 504.16 nm
Ca I 518.89 nm
Ca I 526.56 nm
Ca I 559.45 nm
Na I 589.00 nm
Na I 589.59 nm
Ca I 616.96 nm
Ca I 646.26 nm
H I 656.28 nm

Elemental profiling of laser cladded multilayer coatings by laser induced breakdownspectroscopy and energy dispersive X-ray spectroscopy

Author: Lednev, V. N. ; et. al.

Journal: Applied Surface Science (2017)

Applications

DOI: 10.1016/j.apsusc.2017.04.108

Authors
Bunkin, F. ; Filichkina, V. A. ; Filippov, M. N. ; Grishin, M. Y. ; Pershin, S. M. ; Sdvizhenskii, P. A. ; Stavertiy, A. Y. ; Tretyakov, R. S.

Keywords

Wear resistant coatings; Tungsten carbide; Elemental profiling; Laser induced breakdown spectroscopy; Energy dispersive X-ray spectroscopy; Laser cladded coating;TUNGSTEN CARBIDE; MICROSTRUCTURAL CHARACTERIZATION; COMPOSITE COATINGS; ABLATION; STEEL; LIBS; WEAR; EXCITATION; PLASMA; PULSES

Abstract

Multilayer tungsten carbide wear resistant coatings were analyzed by laser induced breakdown spectroscopy (LIBS) and energy dispersive X-ray (EDX) spectroscopy. Coaxial laser cladding technique was utilized to produce tungsten carbide coating deposited on low alloy steel substrate with additional inconel 625 interlayer. EDX and LIBS techniques were used for elemental profiling of major components (Ni, W, C, Fe, etc.) in the coating. A good correlation between EDX and LIBS data was observed while LIBS provided additional information on light element distribution (carbon). A non-uniform distribution of tungsten carbide grains along coating depth was detected by both LIBS and EDX. In contrast, horizontal elemental profiling showed a uniform tungsten carbide particles distribution. Depth elemental profiling by layer by-layer LIBS analysis was demonstrated to be an effective method for studying tungsten carbide grains distribution in wear resistant coating without any sample preparation. (C) 2017 Published by Elsevier B.V.

Area:

Industry

Material:

Steel ; Tugsten carbide

Elements:

Lines [nm]:

Ni II 241.61 nm Ni II 243.79 nm Ni II 251.09 nm Ni I 503.54 nm

Lines [nm]:

Fe II 247.86 nm Fe I 489.15 nm

Lines [nm]:

W II 248.88 nm W I 505.33 nm

Lines [nm]:

B I 249.77 nm

Lines [nm]:

C I 247.86 nm

...

Emmision lines:
Ni II 241.61 nm
Ni II 243.79 nm
C I 247.86 nm
Fe II 247.86 nm
W II 248.88 nm
B I 249.77 nm
Ni II 251.09 nm
Si I 252.85 nm
Cr I 483.96 nm
Fe I 489.15 nm
Ni I 503.54 nm
W I 505.33 nm

Laser-induced breakdown spectroscopy for three-dimensional elemental mapping of composite materials synthesized by additive technologies

Author: Lednev, V. N. ; et. al.

Journal: Applied Optics (2017)

Applications

DOI: 10.1364/AO.56.009698

Authors
Grishin, M. Y. ; Cheverikin, V. V. ; Peshin, M. ; Sdvizhenskii, P. A. ; Stavertiy, A. Y. ; Taksanc, M. V. ; Tretyakov, R. S.

Keywords

HIGH-SPATIAL-RESOLUTION; STEEL-INDUSTRY; CHEMICAL MAPS; SPECTROMETRY; PLASMA; IDENTIFICATION; LIBS; MICROANALYSIS; CONVERTERS; SAMPLES

Abstract

Three-dimensional multi-elemental mapping of composite wear-resistant coatings by laser-induced breakdown spectroscopy has been demonstrated for the first time, to the best of our knowledge. Individual clads of 1560 nickel alloy reinforced with tungsten carbide were synthesized by a co-axial laser cladding technique. Electron energy dispersive x-ray spectroscopy revealed elemental maps for major elements (W, Ni, Co, Cr, Fe) but failed to measure silicon and carbon. Laser-induced breakdown spectroscopy was utilized for elemental mapping of carbon and all other elements of interest. It was demonstrated that three-dimensional elemental profiling for a few tens of micrometers requires substantial laser spot overlapping during the scanning procedure in order to achieve good accuracy of depth measurements. Elemental maps for nickel, iron, chromium, silicon, tungsten, and carbon were quantified for 900 mu m x 900 mu m x 45 mu m volume with 30 mu m lateral and 4 mu m depth resolution in the case of tungsten carbide particles in nickel alloy. (C) 2017 Optical Society of America

Area:

Industry

Material:

Nickel alloy

Elements:

Lines [nm]:

Fe I 193.45 nm Fe I 370.92 nm Fe I 372.76 nm Fe I 373.49 nm Fe I 374.56 nm Fe I 376.55 nm

Lines [nm]:

B I 181.83 nm B I 182.64 nm B I 208.96 nm

Lines [nm]:

C I 193.09 nm

Lines [nm]:

Si I 190.13 nm

Lines [nm]:

Cr I 200.00 nm

...

Emmision lines:
B I 181.83 nm
B I 182.64 nm
Si I 190.13 nm
C I 193.09 nm
Fe I 193.45 nm
Co II 194.13 nm
Cr I 200.00 nm
W II 207.91 nm
B I 208.96 nm
Fe I 370.92 nm
Fe I 372.76 nm
Fe I 373.49 nm
Fe I 374.56 nm
Fe I 376.55 nm

Laser induced breakdown spectroscopy with picosecond pulse train

Author: Lednev, V. N. ; et. al.

Journal: Laser Physics Letters (2017)

Fundamentals Applications

DOI: 10.1088/1612-202X/aa4fc0

Authors
Davydov, M. A. ; Grishin, M. Y. ; Pershin, S. M. ; Sdvizhenskii, P. A. ; Stavertiy, A. Y. ; Tretyakov, R. S.

Keywords

laser ablation; laser induced breakdown spectroscopy; picosecond pulse train ablation;ND-YAG LASER; QUANTITATIVE-ANALYSIS; Q-SWITCH; ABLATION; PLASMA; SAMPLES; STEEL; GENERATION

Abstract

Picosecond pulse train and nanosecond pulse were compared for laser ablation and laser induced breakdown spectroscopy (LIBS) measurements. A detailed study revealed that the picosecond pulse train ablation improved the quality of laser craters (symmetric crater walls and the absence of large redeposited droplets), which was explained by a smaller heat affected zone and suppression of melt splash. Greater plasma dimensions and brighter plasma emission were observed by gated imaging for picosecond pulse train compared to nanosecond pulse ablation. Increased intensity of atomic and ionic lines in gated and time integrated spectra provided better signal-to-noise ratio for picosecond pulse train sampling. Higher temperature and electron density were detected during first microsecond for the plasma induced by the picosecond pulse train. Improved shot-to-shot reproducibility for atomic/ionic line intensity in the case of picosecond pulse train LIBS was explained by more effective atomization of target material in plasma and better quality of laser craters. Improved precision and limits of detections were determined for picosecond pulse train LIBS due to better reproducibility of laser sampling and increased signal-to-noise ratio.

Area:

Crater shape ; Industry ; Plasma diagnostics

Material:

Low alloy steel

Elements:

Lines [nm]:

Fe I 361.88 nm Fe I 362.20 nm Fe I 363.15 nm Fe I 363.83 nm Fe I 364.04 nm Fe I 364.78 nm Fe I 365.95 nm Fe I 366.95 nm Fe I 367.76 nm Fe I 367.99 nm Fe I 368.22 nm Fe I 368.75 nm Fe I 369.51 nm Fe I 370.11 nm Fe I 370.56 nm Fe I 370.92 nm Fe I 371.99 nm Fe I 372.26 nm Fe I 372.76 nm Fe I 373.49 nm Fe I 373.71 nm Fe I 374.56 nm Fe I 374.83 nm Fe I 375.82 nm Fe I 376.38 nm Fe I 376.55 nm Fe I 532.80 nm Fe I 538.34 nm Fe II 273.07 nm

Lines [nm]:

Si I 288.16 nm

Lines [nm]:

Cr II 283.56 nm

Emmision lines:
Fe II 273.07 nm
Cr II 283.56 nm
Si I 288.16 nm
Fe I 361.88 nm
Fe I 362.20 nm
Fe I 363.15 nm
Fe I 363.83 nm
Fe I 364.04 nm
Fe I 364.78 nm
Fe I 365.95 nm
Fe I 366.95 nm
Fe I 367.76 nm
Fe I 367.99 nm
Fe I 368.22 nm
Fe I 368.75 nm
Fe I 369.51 nm
Fe I 370.11 nm
Fe I 370.56 nm
Fe I 370.92 nm
Fe I 371.99 nm
Fe I 372.26 nm
Fe I 372.76 nm
Fe I 373.49 nm
Fe I 373.71 nm
Fe I 374.56 nm
Fe I 374.83 nm
Fe I 375.82 nm
Fe I 376.38 nm
Fe I 376.55 nm
Fe I 532.80 nm
Fe I 538.34 nm

Author: Sdvizhenskii, P. A.

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Co-author: Sdvizhenskii, P. A.

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