Author: Palleschi, V.

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Co-author: Palleschi, V.

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2 articles found

Quantitative analysis of metals in waste foundry sands by calibration free-laser inducedbreakdown spectroscopy

Author: Pace, D. M. ; et. al.

Journal: Spectrochimica Acta Part B: Atomic Spectroscopy (2017)

Applications

DOI: 10.1016/j.sab.2017.03.007

Authors
Di Rocco, H. O. ; Garcia, F. A. ; Legnaioli, S. ; Lorenzetti, G. ; Miguel, R. E. ; Palleschi, V. ; Pardini, L.

Keywords

Laser-induced breakdown spectroscopy; LIBS; Waste sand; Plasma characterization;SELF-ABSORPTION COEFFICIENTS; INDUCED PLASMA; EMISSION-LINES; NEUTRAL ATOM; LIBS; EMPHASIS; PROFILE; ALLOYS; MATRIX

Abstract

Laser-induced breakdown spectroscopy (LIBS) was applied for quantitative analysis of the elemental composition of waste molding and core sands produced from industry as part of the casting process. To perform the analysis, waste foundry sands (WFS) were collected from metalcasting foundries and prepared in the form of solid pellets with the addition of polyvinyl alcohol as binder. The measurements were carried out using the Mobile double pulse instrument for LIBS analysis (Mod)). The spectral analysis was carried out with the calibration free approach (CF-LIBS). Metal elements commonly found in WFS including Al, Ba, Fe, Li, Mg, Mn, Pb, Ti, Zr, and Zn, were detected and quantified. The metal concentrations for WFS were compared with virgin sand to assess the influence of the casting material as well as the binders used in the foundries to reclaim the sands. The results demonstrated the feasibility of LIBS method as an alternative or complementary technique for the chemical characterization of WFS. (c) 2017 Elsevier B.V. All rights reserved.

Area:

Industry

Material:

Foundry sand

Elements:

Lines [nm]:

Ti I 334.19 nm Ti I 364.27 nm Ti I 365.35 nm Ti I 390.48 nm Ti I 398.18 nm Ti I 399.86 nm Ti I 453.48 nm Ti I 454.88 nm Ti I 498.17 nm Ti I 499.11 nm Ti I 499.95 nm Ti I 500.72 nm Ti I 501.42 nm Ti I 503.84 nm Ti II 323.90 nm Ti II 334.94 nm Ti II 336.12 nm Ti II 337.28 nm Ti II 338.38 nm Ti II 375.93 nm Ti II 376.13 nm

Lines [nm]:

Fe I 249.06 nm Fe I 302.06 nm Fe I 306.72 nm Fe I 357.01 nm Fe I 368.75 nm Fe I 374.56 nm Fe I 374.95 nm Fe I 376.38 nm Fe I 385.64 nm Fe I 385.99 nm Fe I 432.58 nm Fe I 438.35 nm Fe I 440.48 nm Fe II 235.45 nm Fe II 240.49 nm Fe II 258.59 nm Fe II 259.94 nm Fe II 261.19 nm Fe II 273.95 nm Fe II 274.93 nm

Lines [nm]:

Ca I 422.67 nm Ca I 430.77 nm Ca I 431.87 nm Ca I 445.48 nm Ca I 526.56 nm Ca I 559.45 nm Ca I 616.22 nm Ca II 315.89 nm Ca II 317.93 nm Ca I 370.54 nm Ca II 393.37 nm Ca II 396.85 nm Ca II 854.21 nm Ca II 866.21 nm

Lines [nm]:

Zr I 360.12 nm Zr I 458.23 nm Zr I 468.78 nm Zr I 471.01 nm Zr I 473.95 nm Zr I 477.23 nm Zr I 481.50 nm Zr I 482.43 nm Zr II 339.20 nm Zr II 343.82 nm Zr II 349.62 nm Zr II 357.69 nm Zr II 367.47 nm Zr II 369.82 nm

Lines [nm]:

Si I 288.16 nm Si I 243.51 nm Si I 250.69 nm Si I 251.61 nm Si I 251.92 nm Si I 252.41 nm Si I 252.85 nm Si I 263.13 nm Si I 612.50 nm Si II 413.09 nm Si II 637.14 nm

...

Emmision lines:
Fe II 235.45 nm
Fe II 240.49 nm
Si I 243.51 nm
C I 247.86 nm
Fe I 249.06 nm
Si I 250.69 nm
Si I 251.61 nm
Si I 251.92 nm
Si I 252.41 nm
Si I 252.85 nm
Mn II 257.61 nm
Fe II 258.59 nm
Fe II 259.94 nm
Fe II 261.19 nm
Si I 263.13 nm
Fe II 273.95 nm
Fe II 274.93 nm
Mg I 277.98 nm
Mg I 278.30 nm
Mg II 279.55 nm
Mg II 279.80 nm
Mg II 280.27 nm
Mg I 285.21 nm
Si I 288.16 nm
Fe I 302.06 nm
Fe I 306.72 nm
Al I 308.22 nm
Al I 309.27 nm
Ca II 315.89 nm
Ca II 317.93 nm
Ti II 323.90 nm
Zn I 330.26 nm
Ti I 334.19 nm
Ti II 334.94 nm
Ti II 336.12 nm
Ti II 337.28 nm
Ti II 338.38 nm
Zr II 339.20 nm
Zr II 343.82 nm
Zr II 349.62 nm
Fe I 357.01 nm
Zr II 357.69 nm
Al II 358.66 nm
Zr I 360.12 nm
Ti I 364.27 nm
Ti I 365.35 nm
Zr II 367.47 nm
Fe I 368.75 nm
Zr II 369.82 nm
Ca I 370.54 nm
Fe I 374.56 nm
Fe I 374.95 nm
Ti II 375.93 nm
Ti II 376.13 nm
Fe I 376.38 nm
Mg I 383.83 nm
Fe I 385.64 nm
Fe I 385.99 nm
Ti I 390.48 nm
Ca II 393.37 nm
Al I 394.40 nm
Al I 396.15 nm
Ca II 396.85 nm
Ti I 398.18 nm
Ti I 399.86 nm
Mn I 403.08 nm
Mn I 403.31 nm
Pb I 405.78 nm
Sr II 407.77 nm
Si II 413.09 nm
Ca I 422.67 nm
Ca I 430.77 nm
Ca I 431.87 nm
Fe I 432.58 nm
Fe I 438.35 nm
Fe I 440.48 nm
Ca I 445.48 nm
Ti I 453.48 nm
Ti I 454.88 nm
Ba II 455.40 nm
Zr I 458.23 nm
Sr I 460.73 nm
Zr I 468.78 nm
Zr I 471.01 nm
Zr I 473.95 nm
Zr I 477.23 nm
Zr I 481.50 nm
Zr I 482.43 nm
Sr I 486.87 nm
Sr I 489.20 nm
Ba II 493.41 nm
Ti I 498.17 nm
Ti I 499.11 nm
Ti I 499.95 nm
Ti I 500.72 nm
Ti I 501.42 nm
Ti I 503.84 nm
Mg I 516.73 nm
Mg I 518.36 nm
Ca I 526.56 nm
K I 533.97 nm
Ba I 553.55 nm
Ca I 559.45 nm
Na I 589.00 nm
Na I 589.59 nm
Si I 612.50 nm
Ba II 614.17 nm
Ca I 616.22 nm
Mg II 634.67 nm
Si II 637.14 nm
H I 656.28 nm
Li I 670.78 nm
N I 742.36 nm
N I 744.23 nm
N I 746.83 nm
K I 766.49 nm
K I 769.90 nm
O I 777.42 nm
O I 794.76 nm
N I 818.49 nm
N I 818.80 nm
Na I 819.48 nm
N I 824.24 nm
O I 844.64 nm
Ca II 854.21 nm
Ca II 866.21 nm
N I 868.61 nm

Three-dimensional compositional mapping using double-pulse micro-laser-induced breakdownspectroscopy technique

Author: Grassi, R. ; et. al.

Journal: Spectrochimica Acta Part B: Atomic Spectroscopy (2017)

Applications

DOI: 10.1016/j.sab.2016.11.004

Authors
Grifoni, E. ; Gufoni, S. ; Legnaioli, S. ; Lorenzetti, G. ; Macro, N. ; Menichetti, L. ; Pagnotta, S. ; Palleschi, V. ; Poggialini, F. ; Schiavo, C.

Keywords

LIBS; Microscopy; Compositional mapping; 3D analysis; DP-mu LIBS; Euro coins;PLASMA-MASS SPECTROMETRY; LIBS

Abstract

In this communication, we present the development of the first double-pulse micro-LIBS (DP-mu LIBS) instrument for three-dimensional compositional mapping of materials. The system allows for high-resolution three-dimensional scanning of materials; its advantages with respect to conventional single-pulse micro-LIBS systems are described and discussed. As a test example, we analyzed three Euro coins to show the performances of the system on homogeneous samples (20 Eurocents), heterogeneous samples (1 Euro) and layered samples (5 Eurocents). DP-LIBS cannot provide isotopic information and has, typically, limits of detection for the elements of interest much higher with respect to Laser Ablation-Inductively Coupled Plasma-Mass Spectrometry (IA-ICP-MS). However, when the isotopic information and the extreme sensitivity to trace elements is not be necessary, the results obtained show that DP-mu LIBS can be a viable alternative to LA-ICP-MS for the acquisition of high resolution threedimensional compositional maps. (C) 2016 Elsevier B.V. All rights reserved.

Area:

Industry

Material:

Eurocoin

Elements:

Lines [nm]:

Mg I 285.21 nm

Lines [nm]:

Al I 308.22 nm

Lines [nm]:

Fe I 385.99 nm

Lines [nm]:

Ni I 361.94 nm

Lines [nm]:

Cu I 324.75 nm

...

Emmision lines:
Sn I 284.00 nm
Mg I 285.21 nm
Al I 308.22 nm
Cu I 324.75 nm
Zn I 334.50 nm
Ni I 361.94 nm
Fe I 385.99 nm

Author: Palleschi, V.

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Co-author: Palleschi, V.

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